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advanced · Programming · Benchmarking, Noise Characterization & RB

Interleaved RB

Standard randomized benchmarking gives you the average error rate over the whole Clifford group. But often you want the error of one specific gate — say, the controlled-NOT, or a particular single-qubit rotation you suspect is mis-calibrated. Interleaved randomized benchmarking (IRB) isolates exactly that.

The idea: run RB twice

IRB is a difference measurement. You run two RB experiments and compare their decay rates.

  1. Reference experiment. Ordinary RB: random Cliffords, then the inverting Clifford. Fit the decay Fˉ(m)=Apm+B\bar F(m) = A\,p^{\,m} + B to extract the reference depolarizing parameter prefp_{\text{ref}}.
  2. Interleaved experiment. The same, but after every random Clifford you insert the target gate G\mathcal{G} you want to characterize. The sequence becomes C1,G,C2,G,,Cm,GC_1,\, \mathcal{G},\, C_2,\, \mathcal{G},\, \dots,\, C_m,\, \mathcal{G}, followed by the single Clifford that inverts the whole thing. Fit this decay to extract pgatep_{\text{gate}}.

Because the interleaved sequence carries the same random Cliffords plus one copy of G\mathcal{G} per step, the extra decay must come from G\mathcal{G}.

Extracting the gate's error

The ratio of the two depolarizing parameters isolates the target gate. For dimension d=2nd = 2^n, the interleaved gate error is estimated as

rG=(d1)d(1pgatepref).r_{\mathcal{G}} = \frac{(d-1)}{d}\left(1 - \frac{p_{\text{gate}}}{p_{\text{ref}}}\right).

Dividing pgatep_{\text{gate}} by prefp_{\text{ref}} cancels the contribution of the random Clifford "background", leaving the per-application error of G\mathcal{G} alone. The reference run plays the role of a calibration baseline, much as a blank does in a chemistry assay.

Caveats worth knowing

IRB is widely used but it is an estimate, not an exact measurement, and the literature is careful about its limits:

Where IRB fits

Standard RB answers "how good are my gates on average?"; IRB answers "how good is this gate?". The two together let an engineer rank a device's operations, find the weakest link, and target calibration effort where it matters. The next lessons broaden the lens again — from individual gates to whole-device figures of merit such as cross-entropy benchmarking and quantum volume.

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